Prof. Min Xie

About The Author

Min Xie is a chair professor and an associate Dean (internationalization) at the City University of Hong Kong, he received his PhD in Quality Technology in 1987 from Linkoping University in Sweden. Prof. Xie has authored or co-authored over 300 papers and eight books on quality and reliability engineering, including Statistical Models and Control Charts for High-Quality Processes by Kluwer Academic, Advanced QFD Applications by ASQ Press, Weibull Models by John Wiley, and Computing Systems Reliability by Kluwer Academic. Prof Xie has served as chair and committee members in over 100 international conferences and delivered keynote speech at several of them. He has supervised over 30 PhD students. Prof Xie is an elected fellow of IEEE.

Advances in Engineering featured article: A fuzzy TOPSIS and Rough Set based approach for mechanism analysis of product infant failure