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Journal Reference
Journal of Electronic Materials, 2016, Volume 45, Issue 3, pp 1589–1593.
Kubouchi, Y. Ogawa, K. Hayashi, T. Takamatsu, Y. Miyazaki
Department of Applied Physics, Graduate School of Engineering, Tohoku University, Sendai, Japan
Abstract
The crystal structure, thermoelectric properties, and microstructure of polycrystalline samples with nominal compositions Mg2+xSi (x = 0, 0.1, 0.2, 0.3, 0.4, 0.5) have been investigated. It is revealed that the Mg2+xSi samples were composites consisting of Mg2Si matrix with dispersed Mg metal. The Mg2Si crystals contained a small amount of Mg atoms at interstitial (1/2 1/2 1/2) site (Mgi). In addition, Mg metal was present at grain boundaries between Mg2Si crystal grains (MgGB). Regarding thermoelectric properties, the electrical conductivity and Seebeck coefficient of Mg2+xSi were measured and their x dependences were discussed in terms of the amounts of Mgi and MgGB. The amount of MgGB and the electrical conductivity indicate quite similar x dependences.
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