The work described in this paper was also presented at the last SPIE Conference Advances in Optical Thin Films V (Jena, Germany, 7-10 September 2015) and selected for an invited talk (“Wide-range Multimodal Characterization of the Optical Properties of Complex Thin-film Filters”) to be done at the next OSA Conference Optical Interference Coatings (Tucson, Arizona, USA, 19-24 June 2016).
Since the publication of this paper, additional features were added to the set-up, like the ability to achieve reflection and scattering measurements (up to the detection background fixed by Rayleigh scattering limit in air) or the implementation of a self-adaptive mechanism for the tuning of the spectral resolution of the measurements in the range between 0.2 and 2 nm (article in preparation).
Michel Lequime, Simona Liukaityte, Myriam Zerrad, Claude Amra
Institut Fresnel, CNRS, Aix-Marseille Univ. (France)
We present the improved structure and operating principle of a spectrophotometric mean that allows us for the recording of the transmittance of a thin-film filter over an ultra-wide range of optical densities (from 0 to 11) between 400 and 1000 nm. The operation of this apparatus is based on the combined use of a high power supercontinuum laser source, a tunable volume hologram filter, a standard monochromator and a scientific grade CCD camera. The experimentally recorded noise floor is in good accordance with the optical density values given by the theoretical approach. A demonstration of the sensitivity gain provided by this new set-up with respect to standard spectrophotometric means is performed via the characterization of various types of filters (band-pass, long-pass, short-pass, and notch).
© 2015 Optical Society of AmericaGo To Optics Express