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Opt Express. 2013 Aug 12;21(16):19261-8.
Watanabe K, Nakamura Y, Ichikawa M.
Department of Applied Physics, Graduate School of Engineering, The University of Tokyo, 7-3-1 Hongo, Tokyo 113-8656, Japan. WATANABE.Kentaro@nims.go.jp
Abstract
Luminescence imaging of semiconductor surfaces in nanometric resolution is a key to novel optoelectronic nano-devices, which requires local carrierexcitation and local luminescence collection within the nanometric areas at the surfaces. However, there have not been a practical nanospectroscopies applicable to wide range of specimens. STM-cathodoluminescence (STM-CL) nanospectroscopy offers both high spatial resolution (of the order of 10 nm) and novel high carrier excitation power (up to ~1 mW), which enables local luminescence imaging of less-luminescent nano-structures. In this study, we advanced STM-CL technique by introducing a novel optical fiber probe with Cr thin film coating (Cr-FP), which was found to work as a STM probe, as an electron field-emitter for local carrier excitation, and as an alignment-free efficient local STM-CL collector which blinds luminescence after the minority carrier diffusion.
