Impedance spectroscopy analysis of the switching mechanism of reduced graphene oxide resistive switching memory

Solid-State Electronics, Volume 94, April 2014, Pages 61–65.

Nhu Thuy Ho, V. Senthilkumar, Yong Soo Kim.

Department of Physics and Energy Harvest-Storage Research Center, University of Ulsan, Ulsan 680-749, South Korea.

 

Abstract

In this study, we investigated the resistive switching behavior of pristine graphene oxide and thermally reduced GO. Impedance spectroscopy and current–voltage analysis were used to verify the possible physical mechanism of the switching operation. Our observations demonstrated that, the switching operation originates from the oxidation/reduction at the top interface of Al electrode and oxygen migration inside the active layer. Reversible redox reaction Al+1 + xO−2 ↔ AlOx is ground for the conduction electrons.

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