Cantoni C, Gazquez J, Miletto Granozio F, Oxley MP, Varela M, Lupini AR, Pennycook SJ, Aruta C, di Uccio US, Perna P, Maccariello D.
Adv Mater. 2012 Aug 2;24(29):3952-7.
Materials Science and Technology Division, Oak Ridge National Laboratory, TN 37831-6116, USA. [email protected]
Abstract
Using state-of-the-art, aberration-corrected scanning transmission electron microscopy and electron energy loss spectroscopy with atomic-scalespatial resolution, experimental evidence for an intrinsic electronic reconstruction at the LAO/STO interface is shown. Simultaneous measurements of interfacial electron density and system polarization are crucial for establishing the highly debated origin of the 2D electron gas.
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