A modified Rietveld method to model highly anisotropic ceramics

Acta Materialia, Volume 60, Issue 4, February 2012, Pages 1494-1502
G. Tutuncu, M. Motahari, M.R. Daymond, E. Ustundag

 

Department of Materials Science, Iowa State University, Ames, IA 50011, USA

Mechanical and Materials Engineering, Queen’s University, Kingston, Ontario, Canada K7L 3N6

 

Abstract

High energy X-ray diffraction was employed to probe the complex constitutive behavior of a polycrystalline ferroelectric material in various sample orientations. Pb(Zn,Nb)O3–Pb(Zr,Ti)O3 (PZN–PZT) ceramics were subjected to a cyclic bipolar electric field while diffraction patterns were taken. Using transmission geometry and a two-dimensional detector, lattice strain and texture evolution (domain switching) were measured in multiple sample directions simultaneously. In addition, texture analysis suggests that non-180° domain switching is coupled with lattice strain evolution during uniaxial electrical loading. As a result of this material’s high strain anisotropy, the full-pattern Rietveld method was inadequate to analyze the diffraction data. Instead, a modified Rietveld method, which includes an elastic anisotropy term, yielded significant improvements in the data analysis results.

 

 

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