The Young-Feynman two-slits experiment with single electrons: Build-up of the interference pattern and arrival-time distribution using a fast-readout pixel detector

Stefano Frabboni, Alessandro Gabrielli, Gian Carlo Gazzadi, Filippo Giorgi, Giorgio Matteucci, Giulio Pozzi, Nicola Semprini Cesari, Mauro Villa, Antonio Zoccoli
Ultramicroscopy, Volume 116, May 2012

Abstract

The two-slits experiment for single electrons has been carried out by inserting in a conventional transmission electron microscope a thick sample with two nano-slits fabricated by Focused Ion Beam technique and a fast recording system able to measure the electron arrival-time. The detector, designed for experiments in future colliders, is based on a custom CMOS chip equipped with a fast readout chain able to manage up to 106frames per second. In this way, high statistic samples of single electron events can be collected within a time interval short enough to measure the distribution of the electron arrival-times and to observe the build-up of the interference pattern.

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