Aberration-free moiré profilometry—Analysis, simulation and implementation of the optimal setup geometry

Jan A.N. Buytaert, Bart Ribbens, Steve Vanlanduit, Joris J.J. Dirckx
Optics and Lasers in Engineering, Volume 50, Issue 8, August 2012

Abstract

The accuracy of fringe projection profilometry strongly depends on the setup. In this article different setups are discussed, and compared using custom-made freeware simulation software. The best suited geometry for aberration-free measurements on small objects is implemented in a practical setup.

By using specific telecentric lenses and different grid periods, both for projection and observation, we obtain a close to aberration-free phase-shifting projection moiré profilometer. In combination with liquid crystal display panels, the setup becomes practical, versatile and user-friendly.

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