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Applied Surface Science, Volume 282, 2013, Pages 105-114.
Shweta Dhillon, Rama Kant
Department of Chemistry, University of Delhi, Delhi 110007, India
Abstract
Area measurements from cyclic voltammetry (CV) and image from scanning electron microscopy (SEM) are used to characterize electrode statistical morphology, 3D surface reconstruction and its electroactivity. SEM images of single phased materials correspond to two-dimensional (2D) projections of 3D structures, leading to an incomplete characterization. Lack of third dimension information in SEM image is circumvented using equivalence between denoised SEM image and CV area measurements. This CV-SEM method can be used to estimate power spectral density (PSD), width, gradient, finite fractal nature of roughness and local morphology of the electrode. We show that the surface morphological statistical property like distribution function of gradient can be related to local electro-activity. Electrode surface gradient micrographs generated here can provide map of electro-activity sites. Finally, the densely and uniformly packed small gradient over the Pt-surface is the determining criterion for high intrinsic electrode activity.
