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International Journal of Materials Research , Volume 105, Issue 9, 2014.
Toshiyuki Miyazaki*, Toshihiko Sasaki.
Kanazawa University, Kanazawa, Japan.
Abstract
Go To JournalA two-dimensional X-ray diffraction technique for stress measurement is reported. The proposed technique determines the stress from the Fourier series of a Debye–Scherrer ring. This technique does not require sample inclination to several different angles to determine the stress as the conventional sin2 ψ technique does. Although the cos α technique has the same advantage, the proposed technique can also determine stress from an imperfect Debye–Scherrer ring. To measure the effectiveness of the proposed technique, a four-point bending test was performed on a steel specimen to determine the Fourier series of Debye–Scherrer rings. The stresses determined from the Fourier series were consistent with those determined using the cos α technique. The proposed technique is expected to extend the application range of current X-ray stress measurement.
