Advances in Engineering Advances in Engineering features breaking research judged by AE’s advisory team to be of key importance in the Engineering field. Papers are selected from over 10,000 published each week from most peer reviewed journals.
Journal of the European Ceramic Society, Volume 32, Issue 12, September 2012, Pages 3493-3500 SungSic Hwang, Sang Chul Lee, JaeHo Han, Dongyun Lee, Sang-Whan Park
Read More »Electrical Engineering
Thermal cycling analysis of high temperature die-attach materials
Microelectronics Reliability, Volume 52, Issues 9–10, September–October 2012, Pages 2314-2320 L.A. Navarro, X. Perpinà, M. Vellvehi, V. Banu, X. Jordà
Read More »Optimal trajectory determination of a single moving beacon for efficient localization in a mobile ad-hoc network
Ad Hoc Networks, Volume 11, Issue 1, January 2013, Pages 238-256 J. Miles, G. Kamath, S. Muknahallipatna, M. Stefanovic, R.F. Kubichek
Read More »Effect of electron–electron scattering at an elevated temperature on device lifetime of nanoscale nMOSFETs
Microelectronics Reliability, Volume 52, Issues 9–10, September–October 2012, Pages 1905-1908 Seonhaeng Lee, Dongwoo Kim, Cheolgyu Kim, N.-H. Lee, G.-J. Kim, Chiho Lee, Jeongsoo Park, Bongkoo Kang
Read More »Electrical properties and barrier modification of GaAs MIS Schottky device based on MEH-PPV organic interfacial layer
Materials Science in Semiconductor Processing, Volume 15, Issue 4, August 2012, Pages 386-392 Souvik Kundu, Ajit Kumar, S. Banerjee, P. Banerji
Read More »Structural characterization of AlxGa1−xSb grown by LPE
G. Juárez Díaz, J. Díaz-Reyes, J. Martínez-Juárez, M. Galván-Arellano, J.A. Balderas-López Materials Science in Semiconductor Processing, Volume 15, Issue 5, October 2012
Read More »Backend dielectric reliability simulator for microprocessor system
Chang-Chih Chen , Fahad Ahmed, Dae Hyun Kim, Sung Kyu Lim, Linda Milor Microelectronics Reliability, Volume 52, Issues 9–10, September–October 2012
Read More »The application and research of high-frequency ultrasonic reflection technique used in the measurement of small diameter’s tube cavity size
Mingquan Wang, Deshui Han, Shilin Li Measurement, Volume 46, Issue 1, January 2013
Read More »A general hybrid semi-parametric process control framework
Moritz von Stosch, Rui Oliveira, Joana Peres, Sebastião Feyo de Azevedo Journal of Process Control, Volume 22, Issue 7, August 2012
Read More »Active cycling reliability of power devices: Expectations and limitations
W. Kanert Microelectronics Reliability Volume 52, Issues 9–10, September–October 2012, Pages 2336–2341
Read More »When adequate and predictable reliability is imperative
E. Suhir Microelectronics Reliability Volume 52, Issues 9–10, September–October 2012, Pages 2342–2346
Read More »Structural health monitoring of solder joints in QFN package
I. Gershman, J.B. Bernstein Microelectronics Reliability Volume 52, Issue 12, December 2012, Pages 3011–3016
Read More »LMI-based algorithm for strictly positive real systems with static output feedback
M.R. Covacic, M.C.M. Teixeira, E. Assunção, R. Gaino Systems & Control Letters Volume 61, Issue 4, April 2012, Pages 521–527
Read More »A prefilter equalizer for pulse width modulation
Signal Processing, Volume 92, Issue 10, October 2012, Pages 2444-2453 Sven Ole Aase
Read More »Polyfluorene-based semiconductors combined with various periodic table elements for organic electronics
Progress in Polymer Science,Volume 37, Issue 9, September 2012, Pages 1192–1264 Ling-Hai Xie, Cheng-Rong Yin, Wen-Yong Lai, Qu-Li Fan, Wei Huang.
Read More »A generalized approach for design of photonic gas sensors based on Vernier-effect in mid-IR
Sensors and Actuators B: Chemical, Volume 168, 20 June 2012, Pages 402-420 Vittorio M.N. Passaro, Benedetto Troia, Francesco De Leonardis
Read More »Ammonia gas sensor based on pentacene organic field-effect transistor
Sensors and Actuators B: Chemical, Volume 173, October 2012, Pages 133-138 Junsheng Yu, Xinge Yu, Lin Zhang, Hongjuan Zeng
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