Paramps: Tensor-Decomposed Convolutional Networks for Robust Heart Sound Classification and Cardiovascular Diagnosis October 25, 2025 Read More »
Transverse Mode Division as a Pathway to Scalable Spatiotemporal Mode-Locking in Yb-Doped Fiber Lasers October 25, 2025 Read More »
Interface-Controlled Conventional and Inverse Magnetocaloric Effects in GdFeCo Thin Films October 2, 2025 Read More »
Physics-Guided Neural Modeling Enables Reliable In-Situ Characterization of MEMS Materials August 11, 2025 Read More »
Highly Agile and Untethered Centimeter-Scale Swimming Robots for Autonomous Surface Navigation and Environmental Sensing July 21, 2025 Read More »
Hybrid-Dimensional Simulation of GIL: A Fast and Accurate Approach to Electromagnetic-Thermal-Fluid Coupling July 18, 2025 Read More »
Temporal Modulation of Ultrasound Unlocks New Sensitivity in Metal Oxide Gas Sensors July 17, 2025 Read More »
Intelligent Sliding Mode Control for Uncertain Tilt-Rotor UAVs via Real-Time Neural Adaptation July 17, 2025 Read More »
Breaking the Pulse Barrier: Chaos-Driven Submeter Resolution in Long-Distance Raman Fiber Sensing July 17, 2025 Read More »
Wien Filter Correction of Chromatic Deflection Aberration for Large-Field High-Resolution LVSEM: A Practical and Cost-Effective Implementation July 15, 2025 Read More »
Reimagining Dimensionality: Heterostructured Nanowires for Next-Generation Optoelectronics July 12, 2025 Read More »
Bridging Model Fidelity and Deep Learning: A Robust Reconstruction Framework for Lensless Imaging June 22, 2025 Read More »
Improving MoS₂ Photodetectors with Hydrogen Plasma Treatment and Al₂O₃/HfO₂ Passivation June 20, 2025 Read More »
Enhancing p-GaN HEMTs with Composite Layers: Achieving Low On-Resistance, High Breakdown Voltage, and Improved Reliability June 19, 2025 Read More »
Scaling Limits and Stability of Ultra-Thin Ferroelectric Hafnia for Next-Generation Nanoelectronics May 27, 2025 Read More »
Understanding Degradation in GaN and SiC Semiconductors: A Comprehensive Study of Stress-Induced Reliability Challenges May 26, 2025 Read More »